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العنوان
Microinterferometric, Digital Holographic and Microscopic Studies on Fibres and Polymeric Materials /
الناشر
Ahmed Salah El-Dean Ahmed El-Tawargy،
المؤلف
El-Tawargy, Ahmed Salah El-Dean Ahmed.
هيئة الاعداد
باحث / Ahmed Salah El-Dean Ahmed El-Tawargy
مناقش / Ahmed A. Hamza Amin
مشرف / Günter Reiter
مشرف / Wael A. Ramadan El-Saeed
الموضوع
البوليمرات - فيزياء.
تاريخ النشر
2018.
عدد الصفحات
140 p. :
اللغة
الإنجليزية
الدرجة
الدكتوراه
التخصص
الفيزياء وعلم الفلك
تاريخ الإجازة
25/2/2018
مكان الإجازة
جامعة دمياط - كلية العلوم - Physics
الفهرس
Only 14 pages are availabe for public view

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Abstract

In this thesis, optical characterization of materials having different dimensions and structural shapes is performed. The thesis is divided into two parts.
Chapter (1) presents a technical modification of the traditional Mach-Zehnder interferometer by inserting two linear polarizers and a wave rotator in the light’s path. The modified interferometer enables simultaneously obtaining two shifts (double image) corresponding to two orthogonal states of vibration of linearly polarized laser; i.e. parallel (extraordinary) and perpendicular (ordinary) with respect to the fibre’s axis
In chapter (2), the modified Mach-Zehnder interferometer is used to investigate anisotropic textile polypropylene fibres at different temperatures (26 oC- 80 oC) using both normal interferometry and digital holographic techniques.
In chapter (3), the lens-fibre interferometer (LFI) is revisited. It is used here to monitor the variations of a transparent sheet thickness. The sheet is inserted in the path of the interfered rays to produce a geometrical shift (and hence a phase shift).
Chapter (4) presents an introduction about nanoparticles, their methods of crystallization and assembly in monolayers.
In chapter (5), polymeric hard-core/soft-shell colloidal nanoparticles are used to prepare Langmuir monolayers at the air/water interface. The monolayer is in-situ (on water surface) characterized using Brewster angle microscopy while the substrate-supported monolayers are characterized using both optical microscopy and atomic force microscopy.