الفهرس 
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Abstract
After the discovery of laser and holography , the
problem of the interferometry in diffused ~ight, gained the
attention of many workers all-over the world.This resulted in
an enormous number of the publications on various aspects of
the problems.One famous phenomenon is the interferometry and
it’s uses in storing and retrieval of the images.
More or less coherent light scattered from a rough object
or transmitted through a random inhomogeneous medium shows
what’s called II Speckle Patternlt.Thisstructure is due to the
interference effects of the elementary waves emanating from
each element of the scatterer.
It can be said briefly that the random properties of the
pattern depends on the coherence characteristics of the
illuminated source , on the nature of the object and on its
roughness.
Chapter I represents the introduction and the review of
the previous work dealing with studies of the effect of
coherence of the light source and surface roughness of the
diffuser on the statistical properties of the speckle pattern.
ratio m till m=l , then it decreases as m increases.
The derived formulae of the visibility for the three cases
make it possible to obtain the value of the unknown spectral
half width and the ratio between the absolute value of the
amplitude of the reference beam and the integrated scattered
amplitude of the diffused beam simultaneously.
The intensity distribution of the speckle pattern
resulting from different profiles with different half widths
such as Gaussian and Lorentzian profile are also studied
in the second part from this chapter.where their is no
reference beam , case of
.
photography.The visibility was
calculated theoretically by knowing the maximum and minimum
intensity distribution of the speckle pattern.
The effect of roughness on the intensity distribution
of the speckle pattern produced by illuminating a rough object
by a coherent light ”has been investigated in chapter
III.Theoretical relation between the intensity distribution
and the characteristics of the rough surface , has been
developed.
The computational data of this formula for different
surface parameters is given in table.The roughness parameters
of the surface measurements can be easily determined from
this table.It also gives a very simple way for following the
surface parameters pn-line during the poli~hing process.