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Abstract
Accelerated life testing (ALT) is becoming important and widely used in many fields. It is necessary to use the ALT because rapidly changing technologies, higher customer expectations for better reliability, and the need for rapid device development. Also in many situations the failure data at normal operating conditions are lacking and the reliability measure become difficult, if not impossible, to estimate such as the case of the development of a new component or a product. Indeed, there are cases where the reliability of component is high and failure data of the component when operating at normal conditions may not be attainable during its expected life. In such cases, accelerated life testing induces failures, and the failure data at accelerated conditions are used to estimate the reliability at normal operating conditions. Then, ALT is a method to obtain failure data at severer conditions to estimating the reliability of devices at normal use conditions. The failure data is analyzed in terms of a suitable physical statistical model to obtain desired information about a device or its performance under normal use conditions