الفهرس 
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Abstract
Objective: To evaluate the influence of different polishing protocols on the surface topography of polyether ether ketone (PEEK) RPD frameworks fabricated by the CAD/CAM technique. Materials and Methods: Six male patients were enrolled in this split-mouth study. All patients had mandibular Kennedy class I arch form with remaining teeth extending from first premolar on one side to first premolar on the other side and opposed by completely edentulous maxillary arch. Modified polyether ether ketone RPD frameworks were fabricated by CAD/CAM technique. According to the followed polishing protocol, each framework was divided into two sides (2 groups); group I ( right side): polished using Abraso-Starglanz polishing system, and group II ( left side): polished using Acrypol polishing system. Scanning electron microscopy was used for evaluation through Tri-stage scanning; the first scanning was performed before polishing (control), the second was performed after polishing, and the final was performed after two months of denture delivery. Data were collected and analyzed using Student’s t-test and repeated measures ANOVA followed by post-hoc LSD at p-value ≤ 0.05. Results: A significant decrease was found in the surface roughness between the unpolished and polished frameworks for both groups using both tested polishing systems (P<0.001). After two months of denture delivery, significant increase of surface roughness was noticed for both polishing protocols. This increased value was still significantly lower than the values recorded before polishing for both protocols (P<0.001). Polishing with Abraso-Starglaz polishing paste had decreased the total surface roughness of frameworks more significantly than the Acrypol polishing paste. Conclusions: Both used Abraso-Starglaz and Acrypol polishing pastes produced a significantly smoother PEEK surface than that of the non-polished PEEK and polishing with Abraso-Starglaz paste was the most effective and promising polishing technique in production of highly smooth PEEK surface.