الفهرس 
Charge Pump Reliability
Sizing Methodology ValidationOnly 14 pages are availabe for public view
 |  | from | 108 |  |  |
| | | from | 108 | | |
Abstract
A novel sizing methodology for Dickson charge pumps with pure capac- itive loads is presented. The methodology is based on dynamic analysis to minimize the rise time of the charge pump up to 25% under a given circuit area without power or area overhead and paves the way for a com- prehensive rise-time minimization using the optimum number of stages. The methodology allows the designer to choose the pumping capacitor of each stage and thus efficiently utilize the circuit area which is mostly dominated by the pumping capacitors area.
The methodology is validated through the implementation of a six- stage charge pump-based driver in 180-nm standard low-voltage CMOS technology. The driver is used for the excitation of ultrasonic transducers with 34 V at a resonance frequency of 220 KHz. A rise time of only 512 nS
is achieved. The driver consumes 10.6 mA drawn from a 5-V supply at a pumping frequency of 50 MHz and occupies an area of 0.2 mm2.