الفهرس 
Chapter 1 : General BackgroundOnly 14 pages are availabe for public view
 |  | from | 16 |  |  |
| | | from | 16 | | |
Abstract
In our thesis Pure and aluminum doped ZnO as a transparent conducting oxide is deposited into glass substrate using spray pyrolysis technique. The structural study of the prepared ZnO films by X-ray diffraction reveals that films are polycrystalline with hexagonal structure. As the deposition temperature increase the intensity of the (002) peak increases.
The SEM micrographs of prepared ZnO films are densely and uniformly covered where the shape of the crystallites of the film were found to be changed with the deposition temperature, the crystallite size values increase with deposition temperature increase. The prepared ZnO films show highly transparent up to 90% in the invisible region. The transmissions of the films increase as deposition temperature increase. The optical band gap shows no significant change in its values with the increase in the deposition temperature.
The film’s resistivity decreases with the increase in substrate temperature to a value of 1.14 Ω cm and charges mobility 16.6 cm²/Vs for ZnO film deposited at 450˚C .The structural study of the prepared AZO films by X-ray diffraction reveals that The intensity of the (002) peak decreases as the concentration of aluminium increases which is possibly due to segregation of Al2O3 into the grain boundaries, the crystallite sizes decreased with the aluminium concentration increase.
The SEM analysis shows that all films are densely and uniformly covered where the shape of the crystallites of the film were found to be changed with the increasing in Al ratio The transmissions of ZnO:Al film was decrease with the increasing in Al concentration (wt.%).