الفهرس 
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Abstract
A Systematic Investigation of The Structural, Optical And Electrical Properties of Some of Se90-xTe10Pbx (where x=2.5, 5, 7.5 And 15 at. %) Glasses Were Carried Out. The Bulk Samples of The Se90-xTe10Pbx Glasses Were Prepared by The Usual Melt-Quenching Technique. The films of The Se90-xTe10Pbx Glasses Were Deposited Onto Ultrasonically Cleaned Glass Substrates By Thermal Evaporation Technique Under Vacuum of 10-5 Torr. Results of Differential Thermal Analysis (DTA) Under Non-Isothermal Conditions on For Se90-xTe10Pbx Glasses Are Reported And Discussed. On The Other Hand, The Crystallization Parameters Were Calculated Using Different Kinetic Models. Further Evidence For The Structural Transformations, Taking Place In The Se90-xTe10Pbx Glasses Due To Heat Treatment, Has Been Studied Through Scanning Electron Microscope (SEM) And X-ray Diffraction (XRD). The Optical Properties of As-Deposited Se90-xTe10Pbx Films Have Been Studied. Various Optical Constants Have Been Calculated For The Studied Compositions. The Effect of Annealing Temperature on The Optical Properties Of The Se90-xTe10Pbx (where x=2.5 And 7.5 at. %) Thin Films Are Studied. The Dependence of The Electrical Conductivity σ on The Composition For The Se90-xTe10Pbx (x=2.5, 7.5 and 15 At. %) As-Deposited Films Has Been Investigated. The Effect of Annealing On The Electrical Properties of The Se87.5Te10Pb2.5 And Se82.5 e1 P”7.5 Films v`s DiscUrsad Gn Tha Ba3Is Cf Amnrphous, Cryst!lhhne 40aj3f/r-a$inns.